Appendix DGS Evaluation Taken with a 2 MHz Phased Array Probe MWB2PA16TD - 45 : Bandwitdh dependent DGS Diagram: D = 13.28 mm, f = 2 MHz, Bandwidth = 3 % Standard Deviation = 1.3 db Springer International Publishing Switzerland 216 W. Kleinert, Defect Sizing Using Non-destructive Ultrasonic Testing, DOI 1.17/978-3-319-32836-2 19
11 Appendix MWB2PA16TD - 53 : Bandwitdh dependent DGS Diagram: D = 12.88 mm, f = 2 MHz, Bandwidth = 3 % Standard Deviation =.87 db MWB2PA16TD - 6 : Bandwitdh dependent DGS Diagram: D = 12.64 mm, f = 2 MHz, Bandwidth = 3 % Standard Deviation =.97 db
Appendix 111 MWB2PA16TD - 65 : Bandwitdh dependent DGS Diagram: D = 12.43 mm, f = 2 MHz, Bandwidth = 3 % Gain [db] ERS = 3.1 mm Standard Deviation =.65 db Sound Path [mm] MWB2PA16TD - 7 : Bandwitdh dependent DGS Diagram: D = 12.5 mm, f = 2 MHz, Bandwidth = 3 % Standard Deviation = 1.4 db
112 Appendix DGS Evaluation Taken with a 4 MHz Phased Array Probe MWB4PA16TD - 45 : Bandwitdh dependent DGS Diagram: D = 14.54 mm, f = 4 MHz, Bandwidth = 3 % Standard Deviation = 1.45 db MWB4PA16TD - 53 : Bandwitdh dependent DGS Diagram: D = 14.17 mm, f = 4 MHz, Bandwidth = 3 % Standard Deviation = 1.5 db
Appendix 113 MWB4PA16TD - 6 : Bandwitdh dependent DGS Diagram: D = 13.73 mm, f = 4 MHz, Bandwidth = 3 % Standard Deviation = 1.2 db MWB4PA16TD - 65 : Bandwitdh dependent DGS Diagram: D = 13.33 mm, f = 4 MHz, Bandwidth = 3 % Standard Deviation = 1.38 db
114 Appendix MWB4PA16TD - 7 : Bandwitdh dependent DGS Diagram: D = 12.76 mm, f = 4 MHz, Bandwidth = 3 % Standard Deviation = 1.3 db
Further Readings Literature Schlengermann U.: Zur Systematik der Entfernungsabhängigkeit des Druckes im Schallfeld von rechteckigen Ultraschallwandlern, Deutsche Gesellschaft für Akustik (DAGA), VDI-Verlag, 1975, Seiten 441 444 Tietz, H. D.: Ultraschall-Messtechnik, VEB Verlag Technik Berlin, 1969 Wüstenberg H., Schulz E., Möhrle W., Kutzner J.: Zur Auswahl der Membranformen bei Winkelprüfköpfen für die Ultraschallprüfung, Materialprüfung 18, Nr. 7, Juli 1976, Seiten 223 23 Granted Patents and Patent Applications EP 2 229 585 B1 Method for the non-destructive testing of a test object by way of ultrasound and apparatus therefor, GE Sensing & Inspection Technologies GmbH, 5354 Hürth (DE) W.-D. Kleinert, Y. Oberdörfer EP 2 229 586 B1 Method for the non-destructive testing of a test object using ultrasound, and apparatus therefor, GE Sensing & Inspection Technologies GmbH, 5354 Hürth (DE) W.-D. Kleinert, Y. Oberdörfer WO 21/13819 A2 Test probe as well family of test probes for the non-destructive testing of a workpiece by means of ultrasonic sound and testing device, GE Sensing & Inspection Technologies GmbH, 5354 Hürth (DE) W.-D. Kleinert, G. Splitt DE 1 214 11 227 A1 Vorrichtung und Verfahren zur zerstörungsfreien Prüfung eines Prüfllings mittes Ultraschall nach der AVG-Methode, GE Sensing & Inspection Technologies GmbH, 5354 Hürth (DE) W.-D. Kleinert DE 1 214 14 914 A1 Vorrichtung und Verfahren zur zerstörungsfreien Prüfung mittels Ultraschall nach der Vergleichskörpermethode, GE Sensing & Inspection Technologies GmbH, 5354 Hürth (DE) W.-D. Kleinert Springer International Publishing Switzerland 216 W. Kleinert, Defect Sizing Using Non-destructive Ultrasonic Testing, DOI 1.17/978-3-319-32836-2 115
116 Further Readings DE 1 214 14 99 A1 Verfahren und Vorrichtung zur zerstörungsfreien Prüfung eines Prüflings mittels Ultraschall unter Berücksichtigung der frequenzabhängigen Schallschwächung, GE Sensing & Inspection Technologies GmbH, 5354 Hürth (DE) W.-D. Kleinert US 5,511,425 Flaw Detector incorporating DGS, Krautkramer-Branson Inc. W.-D. Kleinert et. al.
Index A Amplitude correction value, 12 14, 17, 89 Area correction, 38 ASME, 2, 85 ASTM, 2, 85 AWS, 2, 85 B Bandwidth, 8, 26, 45, 65, 72, 79, 81, 82, 86, 16 Beam displacement, 51 Bitmap, 15 E EN ISO 16811:212, 9, 49, 53, 65, 79, 81 Equivalent circular transducer, 12 Equivalent reflector size (ERS), 3, 11, 17 F Fast Fourier Transformation, 15 Fastest path, 32, 61 Flat-bottomed hole, 1, 2, 21, 42, 49, 74, 76, 79, 82 L Least squares method, 87, 88, 93, 97 C Calibration standard, 12, 14, 88 Correction angle, 38, 41 Correction factor, 3 D Defect artificial, 1 natural, 1 Delay laws, 47, 48, 6, 61 DGS diagram general, 3, 9, 1, 42, 66, 79, 81, 82 special, 3, 9, 13, 14, 42, 79 DGS scale, 18 DIN EN 583-2:21, 3 Distance amplitude correction (DAC), 2, 7, 26, 85, 88, 89, 95, 97, 15 Distance-gain-size (DGS), 2, 7, 21, 23 26, 3, 38, 42, 45, 48 5, 53, 65, 79, 81, 82, 15 M Mode conversion, 26 N Niklas, L., 51, 52 P Phase shift, 26, 38, 4 Photo elastic effect, 44 Springer International Publishing Switzerland 216 W. Kleinert, Defect Sizing Using Non-destructive Ultrasonic Testing, DOI 1.17/978-3-319-32836-2 R Reference echo, 17, 42, 49, 88, 89, 91, 92, 96 S SAFT, 1 Side-drilled hole, 1, 2, 7, 85, 87 89, 91, 95 Snell s Law, 3, 34, 37, 61 117
118 Index Solid axle, 58, 62 Sound attenuation, 12 16, 21, 49, 91, 92, 15 Sound exit point, 2, 47, 48, 52 Sound field, 23, 24, 29, 41, 53 Sound pressure, 65, 68, 72, 74, 85, 87, 88 Spectrum, 71, 15, 16 T TFM, 1 Time corrected gain (TCG), 19, 95 Transducer nominal, 47 original, 52, 6 virtual, 47, 6 Transfer correction, 12, 13, 16, 89