Publication List: Hendrik Hölscher

Transkript

1 Publication List: Hendrik Hölscher Original Articles 1. H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Simulation of a scanned tip on a NaF (001) surface in friction force microscopy, EUROPHYSICS LETTERS 36, (1996). 2. H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Modeling of the scan process in lateral force microscopy, SURFACE SCIENCE 375, (1997). 3. H. Hölscher, U. D. Schwarz, O. Zwörner, and R. Wiesendanger. Stick-slip movement of a scanned tip on a graphite surface in scanning force microscopy, ZEITSCHRIFT FÜR PHYSIK B 104, (1997). 4. H. Hölscher, U. D. Schwarz, O. Zwörner, and R. Wiesendanger. Consequences of the stick-slip movement for the scanning force microscopy imaging of graphite, PHYSICAL REVIEW B 57, (1998). 5. O. Zwörner, H. Hölscher, U. D. Schwarz, and R. Wiesendanger. The velocity dependence of frictional forces in point contact friction, APPLIED PHYSICS A 66, S263-S267 (1998). 6. H. Hölscher, W. Raberg, U. D. Schwarz, A. Hasbach, K. Wandelt, and R. Wiesendanger. Imaging of sub-cell structures in the contact mode of the scanning force microscope. PHYSICAL REVIEW B 59, (1999). 7. H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Calculation of the frequency shift in dynamic force microscopy, APPLIED SURFACE SCIENCE 140, (1999). 8. H. Hölscher, W. Allers, U. D. Schwarz, A. Schwarz, and R. Wiesendanger. Determination of tip-sample interaction potentials by dynamic force spectroscopy, PHYSICAL REVIEW LETTERS 83, (1999). 9. H. Hölscher, A. Schwarz, W. Allers, U. D. Schwarz, and R. Wiesendanger. Quantitative analysis of dynamic force spectroscopy data on graphite(0001) in the contact and non-contact regime, PHYSICAL REVIEW B 61, (2000). 10. H. Hölscher, W. Allers, U. D. Schwarz, A. Schwarz, and R. Wiesendanger. Interpretation of true atomic resolution images in non-contact atomic force microscopy: Graphite(0001), PHYSICAL REVIEW B 62, (2000). 11. U.D. Schwarz, H. Hölscher, and R. Wiesendanger. Atomic resolution in scanning force microscopy: Concepts, requirements, contrast mechanism, and image interpretation, PHYSICAL REVIEW B 62, (2000). 12. W. Allers, A. Schwarz, H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Dynamic scanning force microscopy at low temperatures, JAPANESE JOURNAL OF APPLIED PHYSICS 39, (2000). 13. H. Hölscher, W. Allers, U. D. Schwarz, A. Schwarz, and R. Wiesendanger. Simulation of NC-AFM Images of Xenon(111), APPLIED PHYSICS A 75, S35-S38 (2001). 14. H. Hölscher, B. Gotsmann, W. Allers, U.D. Schwarz, H. Fuchs, and R. Wiesendanger. On the measurement of conservative and dissipative tip-sample interaction forces with a dynamic force microscope using the frequency modulation technique, PHYSICAL REVIEW B 64, (2001). 15. H. Hölscher, B. Gotsmann, W. Allers, U.D. Schwarz, H. Fuchs, and R. Wiesendanger. Comment on Damping Mechanism in Dynamic Force Microscopy, PHYSICAL REVIEW LETTERS 88, (2002). 16. A. Schwarz, U.D. Schwarz, S. Langkat, H. Hölscher, W. Allers, and W. Wiesendanger. Dynamic force microscopy with atomic resolution at low temperatures. In: PROCEEDINGS OF THE FOURTH INTERNATIONAL WORKSHOP ON NONCONTACT ATOMIC FORCE MICROSCOPY, S. Morita (Editor), APPLIED SURFACE SCI- ENCE 188, (2002). 17. H. Hölscher. Q-controlled dynamic force spectroscopy, SURFACE SCIENCE 515, (2002). 1

2 18. H. Hölscher, S. M. Langkat, A. Schwarz, R. Wiesendanger. Measurement of Three-Dimensional Force Fields with Atomic Resolution using Dynamic Force Spectroscopy, APPLIED PHYSICS LETTERS 81, (2002). 19. S. M. Langkat, H. Hölscher, A. Schwarz, and R. Wiesendanger. Determination of the interatomic forces between an iron coated tip and the nickel and oxygen lattice sites of NiO(001) by the force field spectroscopy method, SURFACE SCIENCE 527, (2003). 20. H. Hölscher, B. Gotsmann, A. Schirmeisen. On dynamic force spectroscopy using the frequency modulation technique with constant excitation, PHYSICAL REVIEW B 68, (2003). 21. A. Schirmeisen, H. Hölscher, B. Ancyzkowski, D. Weiner, M. M. Schäfer, H. Fuchs. Dynamic Force Spectroscopy in UHV Using the Constant-Amplitude And Constant-Excitation Mode, NANOTECHNOLOGY 16, S13- S17 (2005). 22. V. Caciuc, H. Hölscher, S. Blügel, H. Fuchs. Hysteretic Behaviour of the Tip-Sample interaction on InAs(110) Surface: An ab initio Study, NANOTECHNOLOGY 16, S59 S62 (2005). 23. M. Ashino, A. Schwarz, H. Hölscher, U. D. Schwarz, R. Wiesendanger Interpretation of the atomic scale contrast obtained on graphite and single-walled carbon nanotubes in the dynamic mode of atomic force microscopy, NANOTECHNOLOGY 16, S134-S137 (2005). 24. H. Hölscher, B. Anczykowski. Quantitative Measurement of Tip-Sample Interactions by Dynamic Force Spectroscopy in Ambient Conditions, SURFACE SCIENCE 579, (2005). 25. V. Caciuc, H. Hölscher, S. Blügel. Ab initio investigation of NC-AFM image contrast on InAs(110) surface, PHYSICAL REVIEW B 72, (2005). Also selected for the July 18, 2005 issue of VIRTUAL JOURNAL OF NANOSCALE SCIENCE & TECHNOLOGY. 26. A. Schirmeisen and H. Hölscher. Velocity dependence of energy dissipation in dynamic force microscopy: Hysteresis versus viscous damping, PHYSICAL REVIEW B 72, (2005). Also selected for the July 18, 2005 issue of VIRTUAL JOURNAL OF NANOSCALE SCIENCE & TECHNOLOGY. 27. V. Caciuc, H. Hölscher, S. Blügel, and H. Fuchs. Atomic-scale sharpening of silicon tips in non-contact atomic force microscopy, PHYSICAL REVIEW LETTERS 96, (2006). 28. D. Ebeling, H. Hölscher, H. Fuchs, B. Anczykowski, and U. D. Schwarz. Imaging of Biomaterials in Liquids: a Comparison between Conventional and Q-controlled Amplitude Modulation ( Tapping Mode ) Atomic Force Microscopy, NANOTECHNOLOGY 17, S221-S226 (2006). 29. A. Schirmeisen, L. Jansen, H. Hölscher, and H. Fuchs. Temperature Dependence of Point Contact Friction on Silicon, APPLIED PHYSICS LETTERS 88, (2006). 30. H. Hölscher, D. Ebeling, and U. D. Schwarz. Theory of Q-Controlled Dynamic Force Microscopy in Air, JOURNAL OF APPLIED PHYSICS 99, (2006). 31. H. Hölscher and U. D. Schwarz. Q-controlled Dynamic Force Microscopy in Liquids: An Analysis, APPLIED PHYSICS LETTERS 89, (2006). 32. H. Hölscher. Quantitative Measurement of Tip-Sample Forces in Amplitude Modulation Atomic Force Microscopy, APPLIED PHYSICS LETTERS 89, (2006). 33. V. Caciuc, H. Hölscher, S. Blügel, and H. Fuchs. First-principles study of atomic-scale dynamics of clean silicon tips in atomic force microscopy, PHYSICAL REVIEW B 74, (2006). 34. D. Ebeling, H. Hölscher, and B. Anczykowski. Increasing the Q-factor in the Constant-Excitation Mode of Frequency-Modulation Atomic Force Microscopy in Liquid, APPLIED PHYSICS LETTERS 89, (2006). 35. J.-E. Schmutz, H. Hölscher, D. Ebeling, M. M. Schäfer, and B. Anczykowski. Mapping the Tip-Sample Interactions on Biological Samples by Dynamic Force Spectroscopy under Ambient Conditions, ULTRAMICROSCOPY 107, (2007). 2

3 36. H. Hlscher and U. D. Schwarz. Theory of Amplitude Modulation Atomic Force Microscopy With and Without Q-Control, INTERNATIONAL JOURNAL OF NONLINEAR MECHANICS 42, 608 (2007). 37. D. Ebeling and H. Hölscher. Analysis of the Constant-Excitation Mode in Frequency-Modulation Atomic Force Microscopy with Active Q-Control Applied in Ambient Conditions and Liquids, JOURNAL OF APPLIED PHYSICS 102, (2007) 38. V. Caciuc,, H. Hölscher, D. Weiner, H. Fuchs, and A. Schirmeisen. Non-contact atomic force microscopy imaging mechanism on Ag(110): Experiment and first-principles theory, PHYSICAL REVIEW B 77, (2008). 39. J.-E. Schmutz, M.M. Schfer, and H. Hölscher. Colloid Probes with Increased Tip Height for Higher Sensitivity in Friction Force Microscopy and Less Cantilever Damping in Dynamic Force Microscopy, REVIEW OF SCIENTIFIC INSTRUMENTS (in press) 40. H. Hölscher. Theory of Amplitude-Modulation Atomic Force Microscopy, JOURNAL OF APPLIED PHYSICS (in press) 41. N. Atodiresei, V. Caciuc, S. Blgel, and H. Hölscher. Manipulation and Imaging of Aromatic Organic Molecules with Atomically Sharp Tips: The Last Atom Matters, PHYSICAL REVIEW B (submitted) 42. R. Schmidt, C. Lazo, H. Hölscher, U. H. Pi, V. Caciuc, A. Schwarz, R. Wiesendanger, and S. Heinze. Probing the magnetic exchange forces of iron on the atomic scale, PHYSICAL REVIEW LETTERS (submitted) 43. H. Hölscher and D. Ebeling. Friction at Atomic-Scale Step-Edges, PHYSICAL REVIEW LETTERS (submitted) Review Articles 1. U. D. Schwarz, H. Hölscher, H. Bluhm, O. Zwörner, R. Wiesendanger. Tip-sample interaction in contact force microscopy, PTB-Berichte F-30, 1-9 (1998). 2. U. D. Schwarz and H. Hölscher. Reibung auf der Nanometerskala Nanotribologie mit dem Rasterkraftmikroskop, PHYSIKALISCHE BLÄTTER 54, (1998). 3. H. Hölscher, U. D. Schwarz, Nanotribology studied with the scanning force microscope, Proceedings of the European Symposium on Nanomechanical Testing, ZEITSCHRIFT FÜR METALLKUNDE 92, (2001). 4. H. Hölscher, W. Allers, U.D. Schwarz. Dynamische Rasterkraftmikroskopie Atomen auf den Zahn gefühlt, PHYSIK IN UNSERER ZEIT 33 (4), (2002). 5. H. Hölscher, U. D. Schwarz, Friction at the Nanometer-Scale - Nanotribology Studied with the Atomic Force Microscope, Proceedings of the 13th International Colloquium Tribology: Lubricants, Materials, and Lubrication Engineering, (2002). 6. A. Schwarz, H. Hölscher, S. M. Langkat, R. Wiesendanger. Three-Dimensional Force Field Spectroscopy, Proceedings of the STM 03, AIP Conference Proceedings 696, 68 (2003). 7. H. Hölscher, U. D. Schwarz, Theory of Amplitude Modulation Atomic Force Microscopy With and Without Q-Control: A Review, International Journal of Non-Linear Mechanics 42, (2007). 8. H. Hölscher, A. Schirmeisen, U. D. Schwarz, Principles of Atomic Friction: From Sticking Atoms to Superlubric Sliding, Philosophical Transactions of the Royal Society A. (2008). 3

4 Book Contributions 1. U. D. Schwarz, H. Bluhm, H. Hölscher, W. Allers, R. Wiesendanger. Friction in the low-load regime: Studies on the pressure and direction dependence of frictional forces by means of friction force microscopy. In: THE PHYSICS OF SLIDING FRICTION, B. N. J. Persson und E. Tossati (Editoren), NATO ASI Series Vol. 311, Kluwer Academic Publishers, Dordrecht, Holland, pp (1996). 2. H. Hölscher, U. D. Schwarz, R. Wiesendanger. Simulation of scan processes in friction force microscopy. In: MICRO/NANOTRIBOLOGY AND ITS APPLICATIONS, B. Bhushan (Editor), Nato Series E, Kluwer Academic Publishers, Dordrecht, Holland, pp (1997). 3. U. D. Schwarz, H. Hölscher, W. Allers, A. Schwarz, R. Wiesendanger. Investigation of the mechanics of Nanocontacts using a vibrating cantilever technique. In: FUNDAMENTALS OF AND BRIDGING THE GAP BE- TWEEN MACRO- AND MICRO/NANOSCALE TRIBOLOGY, B. Bhushan (Editor), NATO ASI Series E: Applied Physics, Kluwer Academic Publishers, Dordrecht, Holland (2001). 4. U. D. Schwarz, H. Hölscher. Atomic-scale friction studies using scanning force microscopy. In: CRC HAND- BOOK OF MODERN TRIBOLOGY, B. Bhushan (Editor), CRC Press, Inc., Boca Raton, Florida, USA, (2001). 5. H. Hölscher. Analysis of Microscopy and Spectroscopy Experiments. In: NONCONTACT ATOMIC FORCE MICROSCOPY, S. Morita, R. Wiesendanger, E. Meyer (Editors), Springer-Verlag, Heidelberg, Germany, pp (2002). 6. H. Fuchs, H. Hölscher, A. Schirmeisen, Scanning Probe Microscopy. In: K. H. Jürgen Buschow, Robert W. Cahn, Merton C. Flemings, Bernard Ilschner (print), Edward J. Kramer, Subhash Mahajan, and Patrick Veyssiére (updates), Editor(s)-in-Chief, Encyclopedia of Materials: Science and Technology, Elsevier Science Ltd. Oxford (2001), pp. 1 12, (update 2005). 7. H. Hölscher, A. Schirmeisen. Dynamic Force Microscopy and Spectroscopy, in Advances in Imaging and Electron Physics, Vol. 135, ed. by P. H. Hawkes, Elsevier Science Ltd. (London), pp (2005). 8. U. D. Schwarz, H. Hölscher. Dynamic Force Microscopy and Spectroscopy in Vacuum. In Electrical and Electromechanical Characterization by Scanning Probe Microscopy (ed. by S. V. Kalinin and A. Gruverman), Springer-Verlag, New York (2006). 9. H. Hölscher, D. Ebeling, U. D. Schwarz, Q-controlled Dynamic Force Microscopy in Air and Liquids. In Applied Scanning Probe Methods V (ed. by B. Bhushan and H. Fuchs), Springer Verlag, New York, pp (2007). 10. H. Hölscher, A. Schirmeisen, H. Fuchs, Nanoscale Imaging and Force Analysis with Atomic Force Microscopy. In: Nanotechnology, Vol. 2 Nanoprobes (ed. by H. Fuchs), VCH-Verlag, Weinheim, Germany. (in press) Conference Contributions H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Regensburg, Germany, FRÜHJAHRSTAGUNG DER DPG: Theorie und Simulationen zum Reibungskraftmikroskop H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Sesimbra, Portugal, NATO WORKSHOP: MI- CRO/NANOTRIBOLOGY AND ITS APPLICATIONS: Theory and simulation of atomic-scale processes in friction force microscopy U. D. Schwarz, H. Bluhm, H. Hölscher, O. Zwörner, P. Köster, W. Allers, A. Schwarz, and R. Wiesendanger. Fourth International Conference on Nanometer-scale Science and Technology (NANO IV), Beijing, China: Experimental and theoretical aspects of point contact friction H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Bad Honnef, Germany, 167. WE-HERAEUS-SEMINAR: NICHTLINEARE PHYSIK KOMPLEXER SYSTEME : Modellierung des Rasterprozesses in der Reibungskraftmikroskopie U. D. Schwarz, H. Bluhm, H. Hölscher, O. Zwörner, P. Köster, and R. Wiesendanger. Bad Honnef, Germany, 171. WE-HERAEUS-SEMINAR: NANOSTRUKTURWISSENSCHAFT UND -TECHNOLOGIE : Nanotribologie. 4

5 H. Hölscher. Timmendorfer Strand, Germany, 1. WORKSHOP DES GRADUIERTENKOLLEGS PHYSIK NANOSTRUK- TURIERTER FESTKÖRPER : Ein Modell zum Lateralkraftmikroskop H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Münster, Germany, FRÜHJAHRSTAGUNG DER DPG: Auswirkungen der Stick-Slip -Bewegung in der Rasterkraftmikroskopie O. Zwörner, U. D. Schwarz, H. Hölscher, and R. Wiesendanger. Münster, Germany, FRÜHJAHRSTAGUNG DER DPG: Kraftspektroskopische Messungen der Geschwindigkeitsabhängigkeit von Reibungskräften H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Münster, Germany, FRÜHJAHRSTAGUNG DER DPG: Ein Modell zum Lateralkraftmikroskop H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Mainz, Germany, EUROPEAN WORKSHOP ON MICROTECHNOL- OGY AND SCANNING PROBE MICROSCOPY: Simulation of a scanned tip in scanning force microscopy U. D. Schwarz, O. Zwörner, and H. Hölscher. Poznan, Poland, 1 st INTERNATIONAL SYMPOSIUM ON SCANNING PROBE SPECTROSCOPY AND RELATED METHODS (SPS 97): Quantitative friction force spectroscopy and the nature of the tip/sample contact in force microscopy H. Hölscher, O. Zwörner, U. D. Schwarz, and R. Wiesendanger. Hamburg, Germany, 9 th INTERNATIONAL CONFER- ENCE ON SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES (STM 97): The Velocity Dependence of Frictional Forces in Scanning Force Microscopy H. Hölscher, O. Zwörner, and U. D. Schwarz. Hamburg, Germany, 9 th INTERNATIONAL CONFERENCE ON SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES (STM 97): Consequences of the atomic-scale stick-slip -movement in scanning force microscopy U. D. Schwarz, H. Hölscher, H. Bluhm, O. Zwörner, and R. Wiesendanger. Wien, Austria, 2 nd SEMINAR ON QUANTI- TATIV MICROSCOPY: Tip-sample interaction in contact force microscopy H. Hölscher and M. Dreyer. Timmendorfer Strand, Germany, 2. WORKSHOP DES GRADUIERTENKOLLEGS PHYSIK NANOSTRUKTURIERTER FESTKÖRPER : Rasterkraftmikroskopie H. Hölscher, U. D. Schwarz, A. Schwarz, W. Allers, O. Zwörner, and R. Wiesendanger. Marburg, Germany, 186. WE-HERAEUS-SEMINAR: STATISTICAL MECHANICS, NONLINEAR DYNAMICS AND TURBULENCE : Analysis of Nonlinear Dynamics in Scanning Force Microscopy U. D. Schwarz, H. Hölscher, W. Raberg, A. Hasbach, R. Wiesendanger, and K. Wandelt. Regensburg, Germany, FRÜHJAHRSTAGUNG DER DPG: Analyse des Abbildungsprozesses in der Kontaktkraftmikroskopie auf atomarer Skala H. Hölscher, U. D. Schwarz, O. Zwörner, and R. Wiesendanger. Bad Honnef, Germany, 196. HERAEUS-SEMINAR: MATHEMATICAL MODELLING AND ANALYSIS OF NONSMOOTH DYNAMICAL SYSTEMS : Nanotribology with the Scanning Force Microscope. (invited) H. Hölscher, A. Schwarz, U. D. Schwarz, W. Allers, and R. Wiesendanger. Osaka, Japan, 1ST INTERNATIONAL WORKSHOP ON NONCONTACT ATOMIC FORCE MICROSCOPY: Analysis of the Frequency Shift in Noncontact Atomic Force Microscopy H. Hölscher, A. Schwarz, U. D. Schwarz, W. Allers, and R. Wiesendanger. Birmingham, United Kingdom, 5 th INTERNATIONAL CONFERENCE ON NANOMETER-SCALE SCIENCE AND TECHNOLOGY: Towards the Understanding of Dynamic Force Microscopy: Analysis of the Anharmonic Cantilever Oscillations H. Hölscher, W. Allers, U. D. Schwarz, A. Schwarz, and R. Wiesendanger. Basel, Schwitzerland, 3 rd CONFERENCE ON DEVELOPMENT AND TECHNOLOGICAL APPLICATION OF SCANNING PROBE METHODS (SXM3): Determination of the tip-sample potential from the frequency shift in the dynamic mode of atomic force microscopy U. D. Schwarz, W. Allers, H. Hölscher, A. Schwarz, and R. Wiesendanger.Basel, Schwitzerland, 3 rd CONFER- ENCE ON DEVELOPMENT AND TECHNOLOGICAL APPLICATION OF SCANNING PROBE METHODS (SXM3): Towards the understanding of dynamic scanning force microscopy: Analysis of the contrast mechanism H. Hölscher, A. Schwarz, U. D. Schwarz, W. Allers, and R. Wiesendanger. Münster, Germany, FRÜHJAHRS- TAGUNG DER DPG: Rekonstruktion des Spitzen-Proben-Potentials aus der Frequenzverschiebung im dynamischen Modus des Rasterkraftmikroskops. 5

6 H. Hölscher, A. Schwarz, U. D. Schwarz, W. Allers, and R. Wiesendanger. Münster, Germany, FRÜHJAHRSTAGUNG DER DPG: Analyse der Frequenzverschiebung in der Rasterkraftmikroskopie U. D. Schwarz, H. Hölscher, and R. Wiesendanger. Münster, Germany, FRÜHJAHRSTAGUNG DER DPG: Analyse des Kontrastmechanismus in der dynamischen Rasterkraftmikroskopie U. D. Schwarz, W. Allers, H. Hölscher, A. Schwarz, and R. Wiesendanger. Seoul, South-Korea, 10 th INTERNA- TIONAL CONFERENCE ON SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED PROXIMAL PROBE MICROSCOPY (STM 99): Dynamic Scanning Force microscopy in UHV: Physical Principles and Exemplary Experimental Results Obtained at Low Temperatures H. Hölscher, W. Allers, U. D. Schwarz, A. Schwarz, and R. Wiesendanger. Seoul, South-Korea, 10 th INTERNA- TIONAL CONFERENCE ON SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED PROXIMAL PROBE MICROSCOPY (STM 99): Analysis of the Frequency Shift in Dynamic Force Microscopy H. Hölscher, W. Allers, U. D. Schwarz, A. Schwarz, and R. Wiesendanger. Pontresina, Switzerland, 2 nd INTERNA- TIONAL WORKSHOP ON NON-CONTACT ATOMIC FORCE MICROSCOPY (NC-AFM 1999): Simulation of NC-AFM Results for Graphite(0001) H. Hölscher, W. Allers, U. D. Schwarz, A. Schwarz, and R. Wiesendanger. Regensburg, Germany, FRÜHJAHRS- TAGUNG DER DPG: Simulation und Analyse von NC-AFM Bildern: Abbildung der A- und B-Atome der Graphit(0001)- Oberfläche W. Allers, H. Hölscher, A. Schwarz, U. D. Schwarz, and R. Wiesendanger. Regensburg, Germany, FRÜH- JAHRSTAGUNG DER DPG: Analyse der Spitze-Probe-Wechselwirkung im Dynamischen Modus der Rasterkraftmikroskopie H. Hölscher, B. Gotsmann, A. Schwarz, W. Allers, U.D. Schwarz, H. Fuchs, and R. Wiesendanger. Hamburg, Germany, THIRD INTERNATIONAL CONFERENCE ON NON-CONTACT ATOMIC FORCE MICROSCOPY (NC-AFM 2000): On the measurement of the energy dissipation in dynamic force spectroscopy H. Hölscher, W. Allers, A. Schwarz, U.D. Schwarz, and R. Wiesendanger. Hamburg, Germany, THIRD INTER- NATIONAL CONFERENCE ON NON-CONTACT ATOMIC FORCE MICROSCOPY (NC-AFM 2000): Interpretations of true atomic resolution images in non-contact atomic force miscroscopy H. Hölscher, W. Allers, A. Schwarz, U. D. Schwarz, and R. Wiesendanger. Hamburg, Germany, SECOND INTER- NATIONAL CONFERENCE ON SCANNING PROBE SPECTROSCOPY (SPS 2000) Determination and analysis of tip-sample interaction forces by dynamic force spectroscopy H. Hölscher and U. D. Schwarz. Hückelhoven, Germany, EUROPEAN SYMPOSIUM ON NANOMECHANICAL TEST- ING: Friction at the Nanometer-Scale Nanotribology studied with the Atomic Force Microscope. (invited) H. Hölscher, B. Gotsmann, U. D. Schwarz, W. Allers, H. Fuchs, and R. Wiesendanger. Hamburg, Germany, FRÜH- JAHRSTAGUNG DER DPG: Messung konservativer und dissipativer Spitzen-Proben-Kräfte in der dynamischern Rasterkraftmikroskopie mittels Frequenzmodulationstechnik H. Hölscher, B. Gotsmann, W. Allers, U. D. Schwarz, H. Fuchs, and R. Wiesendanger. Vancouver, Canada. STM 2001: Analysis and Simulation of Dynamic Force Microscopy/Spectroscopy A. Schwarz, U. D. Schwarz, S. Langkat, H. Hölscher, W. Allers, and R. Wiesendanger. Kyoto, Japan FORTH INTER- NATIONAL WORKSHOP ON NON-CONTACT ATOMIC FORCE MICROSCOPY (NC-AFM 2001): Dynamic force microscopy at low temperatures U. D. Schwarz, H. Hölscher, W. Allers, S. Langkat, B. Gotsmann, H. Fuchs, and R. Wiesendanger. San Francisco, CA, USA, 48TH INTERNATIONAL SYMPOSIUM OF THE AMERICAN VACUUM SOCIETY AND 15TH INTERNATIONAL IUVSTA VACUUM CONGRESS: Progress in dynamic force microscopy: From high-resolution imaging of insulators to the measurement of dissipative interaction forces H. Hölscher. Stuttgart/Ostfildern, Germany. 13TH INTERNATIONAL COLLOQUIUM TRIBOLOGY: LUBRICANTS, MATERIALS, AND LUBRICATION ENGINEERING: Friction at the Nanometer-Scale - Nanotribology Studied with the Atomic Force Microscope. (invited) 6

7 H. Hölscher, B. Anczykowski, and A. Schirmeisen 5TH INTERNATIONAL CONFERENCE ON NON-CONTACT ATOMIC FORCE MICROSCOPY (NC-AFM 2002): Q-controlled Dynamic Force Spectroscopy S. Langkat, A. Schwarz, H. Hölscher, and R. Wiesendanger. Montreal, Canada. 5TH INTERNATIONAL CONFER- ENCE ON NONCONTACT ATOMIC FORCE MICROSCOPY (NC-AFM 2002): Determination of the Three Dimensional Force Field Between an Iron Coated Tip and NiO(001) with Atomic Resolution V. Caciuc, H. Hölscher, S. Blügel. Eindhoven, The Netherlands. (STM 2003): First-principles Simulation of NC- AFM Image Contrast on InAs(110) H. Hölscher, B. Anczykowski, U. D. Schwarz. Dingle, Ireland. SIXTH INTERNATIONAL CONFERENCE ON NON- CONTACT ATOMIC FORCE MICROSCOPY (NC-AFM 2003): Theory of Q-controlled Dynamic Force Micrsocopy V. Caciuc, H. Hölscher, S. Blügel. Dingle, Ireland. SIXTH INTERNATIONAL CONFERENCE ON NONCONTACT ATOMIC FORCE MICROSCOPY (NC-AFM 2003): First-principles Simulation of NC-AFM Image Contrast on InAs(110) H. Hölscher, B. Anczykowski, U. D. Schwarz. Mainz, Germany. SCANNING PROBE MICROSCOPY AND ORGANIC MATERIALS XII: Theory of Q-controlled Dynamic Force Microscopy H. Hölscher. Berlin, Germany. 10TH EUROPEAN CONFERENCE ON APPLICATIONS OF SURFACE AND INTERFACE ANALYSIS (ECASIA 03): Analytical AFM. (invited technical lecture) L. Jansen, A. Schirmeisen, H. Hölscher, H. Fuchs. FRÜJAHRSTAGUNG DES AK FESTKÖRPERPHYSIK DER DEUTSCHEN PHYSIKALISCHEN GESELLSCHAFT: Temperature dependence of atomic friction on graphite H. Hölscher, B. Anczykowski, U. D. Schwarz. Montreal, Canada. APS MARCH MEETING 2004: Theory of Q-controlled Dynamic Force Microscopy V. Caciuc, H. Hölscher, S. Blügel, H. Fuchs. Wiesbaden, Germany. 7TH INTERNATIONAL CONFERENCE ON NANOSTRUCTURED MATERIALS (NANO2004): Ab initio calculations of tip-sample interactions for the simulation of NC- AFM images of InAs(110) M. M. Schäfer, H. Hölscher, B. Anczykowski, J.-E. Schmutz, A. Schirmeisen, H. Fuchs. Bielefeldt, Germany. SCAN- NING PROBE MICROSCOPIES AND ORGANIC MATERIALS XIII (SPM-Workshop): Quantitative Measurement of Tip- Sample Forces by Dynamic Force Microscopy in Ambient Conditions D. Ebeling, H. Hölscher, U. D. Schwarz, B. Anczykowski, H. Fuchs. Bielefeldt, Germany. SCANNING PROBE MICROSCOPIES AND ORGANIC MATERIALS XIII (SPM-Workshop): Analysis of Q-controlled Dynamic Force Microscopy J.-E. Schmutz, H. Hölscher, M. M. Schäfer, H. Fuchs. Bielefeldt, Germany. SCANNING PROBE MICROSCOPIES AND ORGANIC MATERIALS XIII (SPM-Workshop): Analysis of Dynamic Force Microscopy in Air using the Constant-Excitation Mode H. Hölscher, A. Schirmeisen, B. Anczykowski, H. Fuchs. Sesimbra, Portugal. 3RD ESF-NANOTRIBOLOGY WORKSHOP: Energy dissipation of point contacts measured by dynamic force spectroscopy in UHV and ambient conditions M. M. Schäfer, H. Hölscher, B. Anczykowski, J.-E. Schmutz, A. Schirmeisen, H. Fuchs. Heidelberg, Germany. VEECO USER MEETING: Quantitative Measurement of Tip-Sample Forces by Dynamic Force Microscopy in Ambient Conditions H. Hölscher, M. M. Schäfer, J.-E. Schmutz, B. Anczykowski, H. Fuchs. Madrid, Spain. WORKSHOP ON AD- VANCED DYNAMIC AFM METHODS: Quantitative measurement of tip-sample forces by dynamic force microscopy in ambient conditions D. Ebeling, H. Hölscher, U. D. Schwarz, B. Anczykowski, H. Fuchs. Berlin, Germany. FRÜHJAHRSTAGUNG DER DEUTSCHEN PHYSIKALISCHEN GESELLSCHAFT. Q-Control in der dynamischen Kraftmikroskopie H. Hölscher, J.-E. Schmutz, B. Anczykowski, M. Schäfer, H. Fuchs. Berlin, Germany. FRÜHJAHRSTAGUNG DER DEUTSCHEN PHYSIKALISCHEN GESELLSCHAFT. Quantitative Measurement of Tip-Sample Forces by Dynamic Force Microscopy in Ambient Conditions. 7

8 V. Caciuc, H. Hölscher, S. Blügel, H. Fuchs. Berlin, Germany. FRÜHJAHRSTAGUNG DER DEUTSCHEN PHYSIKALIS- CHEN GESELLSCHAFT. First-principles simulations of NC-AFM image contrast on InAs(110) surface H. Hölscher, V. Caciuc, S. Blügel, H. Fuchs. Porquerolles, France. 4TH ESF NANOTRIBOLOGY WORKSHOP. Hysteretic Behaviour of Point Contacts: An ab initio Study V. Caciuc, H. Hölscher, H. Fuchs, S. Blügel. Sapporo, Japan. 13TH INTERNATIONAL CONFERENCE ON SCANNING TUNNELING/SPECTROSCOPY AND RELATED TECHNIQUES. Atomic-scale sharpening of silicon tips in non-contact atomic force microscopy H. Hölscher, J.-E. Schmutz, J. Falter, A. Schirmeisen, M. M. Schäfer, B. Anczykowski. Sapporo, Japan. 13TH INTERNATIONAL CONFERENCE ON SCANNING TUNNELING/SPECTROSCOPY AND RELATED TECHNIQUES. Dynamic Force Spectroscopy in Vacuum, Air, and Liquids Using the Constant Excitation Mode A. Schirmeisen, H. Hölscher. Sapporo, Japan. 13TH INTERNATIONAL CONFERENCE ON SCANNING TUNNEL- ING/SPECTROSCOPY AND RELATED TECHNIQUES. Velocity Dependence of Energy Dissipation in Dynamic Force Microscopy: Hysteresis versus Viscous Damping D. Braun, J. Falter, A. Schirmeisen, H. Hölscher, H. Fuchs, M. Liebmann, M. Heyde, U. D. Schwarz. Sapporo, Japan. 13TH INTERNATIONAL CONFERENCE ON SCANNING TUNNELING/SPECTROSCOPY AND RELATED TECHNIQUES. Construction of an Atomic Force Microscope Combined with a Field Ion Microscope H. Hölscher, J.-E. Schmutz, D. Ebeling, J. Falter, A. Schirmeisen, M. Schäfer, B. Anczykowski, H. Fuchs. Bad Essen, Germany. 8 th INTERNATIONAL CONFERENCE ON NONCONTACT ATOMIC FORCE MICROSCOPY (NC-AFM 2005): Dynamic Force Spectroscopy in Vacuum and Ambient Conditions Using Constant-Excitation Mode D. Ebeling, H. Hölscher, H. Fuchs, B. Anczykowski, U. D. Schwarz. Bad Essen Germany. 8 th INTERNATIONAL CONFERENCE ON NONCONTACT ATOMIC FORCE MICROSCOPY (NC-AFM 2005): Analysis of Q-controlled Dynamic Force Microscopy in Air and Liquids J.-E. Schmutz, H. Hölscher, M. Schäfer, H. Fuchs. Bad Essen Germany. 8 th INTERNATIONAL CONFERENCE ON NONCONTACT ATOMIC FORCE MICROSCOPY (NC-AFM 2005): A Comparison Between Tapping- and Constant- Excitation-Mode in the Dynamic Force Microscopy V. Caciuc, H. Hölscher, H. Fuchs. Bad Essen Germany. 8 th INTERNATIONAL CONFERENCE ON NONCONTACT ATOMIC FORCE MICROSCOPY (NC-AFM 2005): Intrinsic Atomic-Scale Sharpening of Silicon Tips in Atomic Force Microscopy H. Hölscher, U. D. Schwarz. Baltimore (MD), USA. APS MARCH MEETING 2006, Theory of Q-Controlled Dynamic Force Microscopy in Liquids J.-E. Schmutz, M. Schäfer, H. Hölscher. Dresden, Germany. FRÜHJAHRSTAGUNG DER DEUTSCHEN PHYSIKALIS- CHEN GESELLSCHAFT. Using the Constant-Excitation Mode as a Spectroscopy Tool in Ambient Conditions D. Braun, T. König, J. Falter, A. Schirmeisen, H. Hölscher, M. Liebmann, U. D. Schwarz, H. Fuchs. Dresden, Germany. FRÜHJAHRSTAGUNG DER DEUTSCHEN PHYSIKALISCHEN GESELLSCHAFT. Towards the analysis of force interactions of atomically defined tip-sample contacts D. Ebeling, H. Hölscher, U. D. Schwarz, H. Fuchs. Dresden, Germany, FRÜHJAHRSTAGUNG DER DEUTSCHEN PHYSIKALISCHEN GESELLSCHAFT. Theoretical Analysis of Q-controlled Dynamic Force Microscopy in Ambient Conditions L. Jansen, A. Schirmeisen, H. Hölscher, H. Fuchs. Dresden, Germany, FRÜHJAHRSTAGUNG DER DEUTSCHEN PHYSIKALISCHEN GESELLSCHAFT. Temperature dependence of point-contact friction on silicon T. König, D. Braun, J. Falter, A. Schirmeisen, H. Hölscher, M. Liebmann, U. D. Schwarz, H. Fuchs. Dresden, Germany FRÜHJAHRSTAGUNG DER DEUTSCHEN PHYSIKALISCHEN GESELLSCHAFT. Design of a low temperature Tuning Fork Atomic Force Microscope combined with a Field Ion Microscope H. Hölscher, Montpellier - La Grande Motte, France. SPM 2006 CONFERENCE - SCANNING PROBE MICROSCOPY, SENSORS & NANOSTRUCTURES. Quantitative Measurement of Tip-Sample Forces in Amplitude Modulation Atomic Force Microscopy H. Hölscher, A. Schirmeisen, D. Ebeling, Waterville, Maine, USA. THE 2006 GORDON RESEARCH CONFERENCE ON TRIBOLOGY. Velocity Dependence of Energy Dissipation in Dynamic Force Microscopy: Hysteresis versus Viscous Damping in Ambient Conditions and Vacuum A. Schirmeisen, L. Jansen, H. Hölscher, H. Fuchs, Waterville, Maine, USA. THE 2006 GORDON RESEARCH CONFERENCE ON TRIBOLOGY. Temperature dependence of point contact friction on silicon. 8

9 H. Hölscher, J.-E. Schmutz, D. Ebeling, M. M. Schäfer, B. Anczykowski, Kobe, Japan. 9TH INTERNATIONAL CONFERENCE ON NONCONTACT ATOMIC FORCE MICROSCOPY (NC-AFM 2006). Dynamic Force Microscopy and Spectroscopy in Air and Liquids using the Constant-Excitation Mode with Q-Control U. D. Schwarz, H. Hölscher, D. Ebeling, Kobe, Japan. 9TH INTERNATIONAL CONFERENCE ON NONCONTACT ATOMIC FORCE MICROSCOPY (NC-AFM 2006). The role of tip-sample forces in Q-controlled dynamic force microscopy V. Caciuc, H. Hölscher, H. Fuchs, Kobe, Japan. 9TH INTERNATIONAL CONFERENCE ON NONCONTACT ATOMIC FORCE MICROSCOPY (NC-AFM 2006). Simulation of Non-Contact Atomic Force Microscopy of Ag(110) H. Hölscher, Tilton (NH), USA. THE 2006 GORDON RESEARCH CONFERENCE ON SCIENCE OF ADHESION. Energy Dissipation of Nanoscale Contacts Examined by Atomic Force Microscopy (invited talk) H. Hölscher, A. Schirmeisen, L. Jansen, P. Köchling, H. Fuchs, Göttingen, Germany, TRIBOLOGIE-FACHTAGUNG DER GFT 2006: Temperature Dependence of Point-Contact Friction on Silicon H. Hölscher, Berlin, Germany. NANODE 2006, 3. BMBF-Nanotechnologietage: Von der Idee zum Produkt. (invited talk) H. Hölscher, Jena, Germany. INNOVATIONSFORUM NANOBASIERTE UMWELTTECHNOLOGIE : Von der Idee zum Produkt. (invited talk) H. Hölscher, Moscone West Convention Center San Francisco (CA), USA. AVS 53RD INTERNATIONAL SYMPO- SIUM & EXHIBITION: Quantitative Measurement of Tip-Sample Forces in Amplitude Modulation Atomic Force Microscopy H. Hölscher, J.-E. Schmutz, D. Ebeling, M. M. Schäfer. Tampa (FL), USA. 30TH ANNUAL MEETING OF THE ADHESION SOCIETY: Measurement of Adhesion and Contact Stiffness at the Nano-Scale Using Dynamic Force Spectroscopy D. Ebeling, H. Hölscher, J.-E. Schmutz, B. Anczykowski. Regensburg, Germany. JAHRESTAGUNG DER DEUTSCHEN PHYSIKALISCHEN GESELLSCHAFT UND DPG FRÜHJAHRSTAGUNG DES ARBEITSKREISES FESTKÖRPERPHYSIK: Increasing the Q-factor in the constant-excitation mode of frequency-modulation atomic force microscopy in liquid J.-E. Schmutz, H. Hölscher. Regensburg, Germany. JAHRESTAGUNG DER DEUTSCHEN PHYSIKALISCHEN GESELLSCHAFT UND DPG FRÜHJAHRSTAGUNG DES ARBEITSKREISES FESTKÖRPERPHYSIK: Investigation of Polymer Surfaces by Dynamic Force Spectroscopy P. Köchling, M. Schäfer, J.-E. Schmutz, H. Hölscher. Regensburg, Germany. JAHRESTAGUNG DER DEUTSCHEN PHYSIKALISCHEN GESELLSCHAFT UND DPG FRÜHJAHRSTAGUNG DES ARBEITSKREISES FESTKÖRPERPHYSIK: Measuring the Anisotropy of Atomic-Scale-Friction by Friction Force Microscopy D. Braun, J. Falter, A. Schirmeisen, H. Hölscher, U. D. Schwarz, and H. Fuchs. Regensburg, Germany. JAHRESTA- GUNG DER DEUTSCHEN PHYSIKALISCHEN GESELLSCHAFT UND DPG FRÜHJAHRSTAGUNG DES ARBEITSKREISES FESTKÖRPERPHYSIK: Force Interactions in Atomically Defined Tip-Sample Contacts P. Köchling, M. M. Schäfer, J.-E. Schmutz, H. Hölscher. Santa Margeherita di Pula, Sardinia, Italy. 6 t h ESF- NANOTRIBOLOGY WORKSHOP: Measuring the Anisotropy of Atomic-Scale-Friction by Friction Force Microscopy D. Ebeling, H. Hölscher, B. Anczykowski. Münster, Germany. NANOBIO-EUROPE 2007: Dynamic Force Microscopy and Spectroscopy for Biological Applications H. Hölscher, D. Ebeling, J.-E. Schmutz, M. M. Schäfer, and B. Anczykowski. Santa Barbara, CA, SA. SEEING AT THE NANOSCALE V: Quantitative Dynamic Force Spectroscopy in Air and Liquids H. Hölscher, V. Caciuc, A. Schirmeisen, D. Weiner, H. Fuchs. Antalya, Turkey. 10 th INTERNATIONAL CONFER- ENCE ON NON-CONTACT ATOMIC FORCE MICROSCOPY: Energy Dissipation on Ag(110): A combined Experimental and ab-initio Study D. Ebeling, H. Hölscher, B. Anczykowski. Antalya, Turkey. 10 th INTERNATIONAL CONFERENCE ON NON- CONTACT ATOMIC FORCE MICROSCOPY: Dynamic Force Microscopy and Spectroscopy for Biological Applications. Invited Seminar Talks at Other Institutes H. Hölscher, U. D. Schwarz, and R. Wiesendanger. Cologne, Germany, Mathematisches Institut der Universität Köln: Reibung auf der Nanometerskala Nanotribologie mit dem Rasterkraftmikroskop. 9

10 H. Hölscher. Jülich, Germany, Institut für Festkörperforschung des Forschungszentrums Jülich: Physical Mechanisms of Atomic Force Microscopy H. Hölscher. Mainz, Germany, Institut für Physik, Johannes Gutenberg Universität: Reibung auf der Nanometerskala Nanotribologie mit dem Rasterkraftmikroskop H. Hölscher. Robert Bosch GmbH, Stuttgart-Schillerhöhe: Germany, Reibung auf der Nanometerskala Nanotribologie mit dem Rasterkraftmikroskop H. Hölscher. Munich, Germany, Ludwig Maximilliams Universität München, Physical Chemistry Department: Dynamische Rasterkraftmikroskopie H. Hölscher. Münster, Germany, Friedrich-Wilhelms-Universität Münster, Physikalisches Institut: Dynamische Rasterkraftmikroskopie H. Hölscher, Duisburg, Germany, Universität Duisburg-Essen, AG Möller: Velocity Dependence of Energy Dissipation in Dynamic Force Microscopy: Hysteresis versus Viscous Damping H. Hölscher, London Centre for Nanotechnology, London, UK: Nano-Metrology using Dynamic Force Spectroscopy H. Hölscher, Kiel, Germany, Christian Albrechts Universität, Technische Fakultät: Ab-initio Simulationen als Werkzeug für die Nanotechnologie H. Hölscher, Illmenau, Technische Universität Illmenau: Atomen auf den Zahn gefüllt H. Hölscher, Freiburg, Germany, Fraunhofer-Institut für Werkstoffmechanik (IWM): Nano-Tribologie mit dem Rasterkraftmikroskop H. Hölscher, Institut für Mikrostrukturtechnik (IMT), Forschungszentrum Karlsruhe: Rasterkraftmikroskopie: Mechanische Sensoren am Limit 10